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Home > Products & Services > Metrology > Hardware & Equipment

Hardware & Equipment

Measurement of lens geometry using a co-ordinate measuring machine
Measuring a large flat using a Fizeau interferometer with the aid of a return flat

Measurement of lens geometry using a co-ordinate
measuring machine

Measuring a large flat using a Fizeau interferometer with the aid of a return flat

 

Measuring sphere roundness errors
Measuring the properties of an etalon with a laser

Measuring sphere roundness errors

Measuring the properties of an etalon with a laser

 

Ellipsometer to measure thicknesses of thin layers such as films and coatings
An ellipsometer mounted on wheels

Ellipsometer to measure thicknesses of thin layers such as films and coatings

An ellipsometer mounted on wheels

 

LADI300: A large aperture digital interferometer with a Fizeau configuration
OSP130: An optical surface profiler for measuring surface topology. Units like this are currently being used by mints internationally

LADI300: A large aperture digital interferometer
with a Fizeau configuration

OSP130: An optical surface profiler for measuring surface topology. Units like this are currently being used by mints internationally


Another profiling microscope to measure microroughness
 

A profiling microscope to measuring microroughness

 

Contact:
Ms Katie Green
Materials and Fabrication Manager
Phone: +61 2 9413 7620
fax: +61 2 9413 7200
Email:acpo

 
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Last updated by Peter Saunders 7 February, 2012

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