Dr BF Oreb
J. Burke, B. Oreb, B. Platt, B. Nemati: Precision metrology
of dihedral angle error in prisms and corner cubes for the Space
Interferometry Mission, in: Optical Manufacturing and Testing
VI, Proc. SPIE 5869 (2005), 225-235, ISBN 0-8194-5874-0 –
CIP 2302
J. Burke, B. Oreb, R. Netterfield: Customized three-flat calibration
method for a 320 mm aperture Fizeau interferometer with vertical
optical axis, in: Precision Interferometric Metrology, Proc. ASPE
(2005), 31, ISBN 1-887706-38-0 – CIP 2306
B. Oreb, J. Burke, R. Netterfield, J. Seckold, A. Leistner,
M.Gross and S. Dligatch: Development of precision double corner
cubes for the Space Interferometer Mission, in (Invited Paper):
Interferometry XIII: Techniques and Analysis, Proc. SPIE 6292(2006),
ISBN 0-8194-5874-0 – CIP 2479
Hibino, K., Larkin, K.G., Oreb, B.F., and Farrant, D.I. and Phase-shifting
algorithms for nonlinear and spatially nonuniform phase shifts:
reply to comment. J.Opt. Soc. Amer.A., 15: 1234-35, (1998).
Farrant, D.I., Kaufmann, G.H., Petzing, J.N., Tyrer, J.R. and
Oreb, B.F. Measurement of transient deformations with dual-pulse
addition electronic speckle-pattern interferometry, Appl. Opt.,37:
7259-7267, (1998).
Walsh, C.J.,Leistner, A.J., Seckold, J., Oreb, B.F., and Farrant,
D.I. Fabrication and measurementof optics for the Laser Inerferometer
Gravitational Wave Observatory. Appl. Opt.,38:2870-2879, (1999).
Matsuda, K., Barnes, T.H., Oreb, B.F. and Sheppard, C.R. Focal
length measurement by Multiple Beam Shearing Interferometry. Appl.
Opt.,38:3542-3548, (1999)[TIPP 654]
Walsh, C.J.,Leistner, A.J., and Oreb, B.F. Power spectral density
analysis of optical substrates for gravitational-wave interferometry.
Appl. Opt.,38:4790-4801, (1999).
Fairman, P.S., Ward, B.K., Oreb, B.F., Farrant D.I., Gilliand,
Y., Freund,C.H., Leistner, A.J., Seckold, J.A, and Walsh. C.J.
300-mm-aperture phase-shifting Fizeau interferometer. Opt. Eng.
vol.38 no.8, 1371?1380(1999).
Matsuda, K., Barnes, T.H., Oreb, B.F. and Sheppard, C.R. Position
magnifying sensor. Opt. Commun., 170:309-318, (1999).
Oreb,B.F., Farrant,D.I., Walsh,C.J., Forbes, G., and Fairman,
P.S. Calibration of a 300-mm phase-shifting Fizeau interferometer.
Appl. Opt.,39: 5161-5171, (2000).
Sjodahl, M., Oreb, B.F. Stitching interferometric measurement
data for inspection of large optical components, Opt.Eng., 41:
403-408 (2002)
Farrant, D.I., Leistner, A.J., Oreb, B.F., Suchting, M.A. and
Walsh, C.J. Metrology of LIGO pathfinder optics, Proc. SPIE Conf.
on Optical Manufacturing and Testing II, San Diego USA, SPIE Vol.
3134, 27-29 July (1997).
Netterfield, R.P., Drage, D.J., Freund, C.H., Walsh C.J., Leistner,
J.A., Seckold, J.A., and Oreb, B.F. Coating requirements for the
reference flat of a Fizeau interferometer used for measuring from
uncoated to highly reflecting surfaces. Proc. EOS-SPIE Symposium
on Optical Systems Design and Production, Advances in Optical
Interference coatings Conf., Berlin Germany, SPIE Vol. 3738, 128-135,
May (1999).
Leistner, A.J., Seckold, J.A., Oreb,B.F., and Walsh, C.J. Precision
figuring of long radius (>10km) optical surfaces. Proc. EOS-SPIE
Symposium on Optical Systems Design and Production, Optical Fabrication
and Testing Conf., Berlin Germany, SPIE Vol. 3739-05, May (1999).
Matsuda, K., Barnes, T.H., Oreb, B.F. and Sheppard, C.R. Focal
Length Measurement By Multiple Beam Shearing Interference. Accepted
for Proc. Of 32 nd ISATA Conf. Vienna Austria 14-18 June (1999)
[TIPP 653].
Walsh,C.J., Leistner,A.J., Oreb,B.F., Seckold, J.A., Farrant,D.I.,
Bulla,R., Davis,G., Lennox,P., Lesha,F., Pavlovic,E., Stuart,W.,
Sona,C., and Yin,R. Manufacture of LIGO core optics at CSIRO.
Proc. SPIE 44th Annual Conf. Optical Manufacturing and Testing
III, Denver USA, SPIE Vol. 3782-24, July (1999).
Leistner,A.J., Walsh,C.J., Oreb,B.F., Seckold, J.A., Pavlovic,E.,
and Farrant,D.I. LIGO optics manufacture: figuring transmission
core optics for best performance. Proc. SPIE 44th Annual Conf.
Optical Manufacturing and Testing III, Denver USA, SPIE Vol. 3782-25,
July (1999).
Oreb,B.F., Netterfield,R.N., Walsh,C.J., Freund,C.H., Leistner,A.J.,
and Seckold, J.A. Characterisation of wavefront variations in
coated optics. Proc. SPIE 44th Annual Conf. Optical Manufacturing
and Testing III Denver USA, SPIE Vol. 3782-26, July (1999) [TIPP
636].
Leistner,A.J., Oreb,B.F., and Walsh,C.J. Precision optics for
long baseline interferometry (invited paper). Proc. ICO 18 Congress,
Optics for the Next Millennium, San Francisco USA, SPIE Vol. 3749-86,186-7,
August (1999).
Farrant,D.I., Petzing, J.N., Tyrer, J.R., and Oreb, B.F. Combined
deformation and shape measurement with ESPI. Proc. SPIE Conf.
Interferometry '99, Techniques and Technologies, Poland SPIE Vol.
3744-62, 474-481, Sept.(1999).
Walsh,C.J., Leistner,A.J., Oreb,B.F., Seckold, J.A., Farrant,D.I.,
and Pavlovic,E. Metrology of transmission optics for LIGO. Proc.
SPIE Conf. Interferometry '99, Applications, Poland SPIE Vol.
3745-46, 331-339, Sept.(1999).
Oreb,B.F., Farrant,D.I., Walsh,C.J., Leistner,A.J., Lesha,F.J.,
Fairman,P.S., and Sona,C.M. Metrology of LIGO core optics. Proc.
SPIE Conf. Interferometry '99, Techniques and Technologies, Poland
SPIE Vol. 3744-03, 18-30, Sept.(1999).
Leistner,A.J., Oreb,B.F., Seckold, J.A., Farrant,D.I., and Pavlovic,E.
Metrology of transmission optics for LIGO. Proc. SPIE Conf. Interferometry
'99, Applications, Poland SPIE Vol. 3745-46, 331-339, Sept.(1999).
Oreb,B.F., Leistner,A.J., Billingsley, G., Kells, W.,and Camp,
J. Interferometric measurement of refractive index inhomogeneity
on polished sapphire substrates: application to LIGO-II Proc.
SPIE Conf. Optical Manufacturing and Testing IV, SPIE Vol. 4451-46,
July-Aug.(2001).
Fairman,P.S., and Oreb,B.F. Assessment of relief measurement
accuracy from the photometric stereo method. , ACOLS 98, Conf.
of Aust. Opt. Soc. , Christchurch NZ, 14-17 December, (1998),113,
[TIPP 655]
Bulla, R., Davis, G., Farrant, D., Leistner, A., Lesha, F., Oreb,
B., Pavlovic, E. Seckold, J., Sona, C., Stuart, W., and Walsh,
C., LIGO Core Optics Fabrication and Testing, ACOLS 98, Conf.
of Aust. Opt. Soc. , Christchurch NZ, 14-17 December, 118,(1998).
Walsh, C., Bulla, R., Davis, G., Farrant, D., Leistner, A., Lesha,
F., Oreb, B., Pavlovic, E. Seckold, J., Sona, and C., Stuart,
W., Fabrication and measurement of optics for gravitational wave
detectors, ACOLS 98, Conf. of Aust. Opt. Soc. , Christchurch NZ,
14-17 December, 261,(1998), and AIP Congress, Perth, Sept. (1998).
Oreb, B.F., Netterfield,R.P., Walsh, C.J.,Freund, C.H., Leistner,
A.J., and Seckold, J.A. Distortion and phase effects of coatings
on precision optical surfaces. 12 th Conf. of Aust. Opt. Soc.
, University of Sydney, 5-9 July(1999).
Netterfield,R.P., Drage,D.J., Freund,C.H., Walsh,C.J., Leistner,A.J.,
Seckold,J.A., and Oreb,B.F. Surface figure measurement of reflecting
optical surfaces in a Fizeau interferometer. ACOLS 98, Conf. of
Aust. Opt. Soc. , Christchurch NZ, 14-17 December,113,(1998).
Farrant,D.I., and Oreb, B.F. Shape measurement with speckle interferometry.
12 th Conf. of Aust. Opt. Soc. , University of Sydney, 5-9 July(1999).
Matsuda,K., Barnes,T.H., Oreb,B.F., and Sheppard,C.J.R. Focal
length measurements using multiple beam shearing interferometry.
12 th Conf. of Aust. Opt. Soc. , University of Sydney, 5-9 July(1999).
Oreb, B., Green,K., Pavlovic, E., and Walsh C. Interferometric
measurement of refractive index homogeneity on polished substrates.
13 Conf. of Aust. Opt. Soc.+ AIP2000, University of Adelaide ,
10-15 Dec(2000).
Oreb, B., Walsh, C. and Leistner, A. Precision interferometric
measurement of right angles with the aid of an etalon. 13 Conf.
of Aust. Opt. Soc.+ AIP2000, University of Adelaide , 10-15 Dec(2000).
Hibino, K., Oreb, B.F., Fairman P., Refractive index inhomogeneity
measurement of a parallel plate in a Fizeau interferometer by
a new wavelength scanning algorithm, 19th Congress of the International
Commission for Optics, Firenze, 2002, SPIE Vol 4829 pp. 847-848
August 2002
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