Metrology
Adams, R.; Berman, M.; Buckley, M.; Farrant, D. I.; Freund, C.
H.; Hegedus, Z. S.; Oreb, B. F., and Walsh, C. J. Measurements
of fine tolerance automotive components using light sectioning
techniques. Proc. Internat. Symposium on Automotive Technology
Applications (ISATA); Aachen, Germany. 1993.
Bulla R; Davis G; * Farrabt D; Leistner A; Lesha F; Oreb B; Pavlovic
E; Seckold J; Sona C; Stuart W, and * Walsh C. Fabrication and
measurement of optics for gravitational wave detectorsFremantle,
WA; 1998.
Creath K; Gilliand Y A, and Hariharan P. Interferometric testing
of high-numerical-aperture convex surfaces. Appl. Opt. 1994; 33(13):25858.
Creath K and Hariharan P. Phase-shifting errors in interferometric
tests with high NA reference surfaces. Appl. Opt.
D I FARRANT; A J LEISTNER; B F OREB; M A SUCHTING, and C J WALSH.
'Metrology of LIGO pathfinder optics'.
D I FARRANT; G H KAUFMANN; J N PETZING; J R TYRER; B F OREB,
and D KERR. 'Transient deformation measurement using dual-pulse
addition
ESPI'; 1997.
Dabbs; T.; Hegedus; Z.; Sobey; P. and Glass, and M. Distance
measurement using an astigmatic confocal microscope.
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FPIEWECK F; PEUTO A; PETTORUSSO S; MOSCA M; FUJII K; TANAKA M;
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Dligatch S; Netterfield RP, and Drage DJ. In-Situ Ellipsometric
Monitoring of Multilayer Optical CoatingsSydney University; 1999.
Drage D J and Netterfield R P. In Situ Elliposmetric Monitoring
of A Dielectric Multilayer Edge Filter ; 1998.
Drage DJ; Netterfield RP, and Freund CF. In Situ Ellipsometric
Monitoring of Dielectric Optical Thin Films; 1998.
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Fairman PS and Oreb BF. Assessment of relief measurement accuracy
from the photometric stereo methodChristchurch; 1998.
Fairman PS; Ward BK; Oreb BF, and Farrant DI. A 300-MM Aperture
Phase-Shifting Fizeau InterferometerAdelaide: University of Adelaide;
1997: 12.
Fairman PS; Ward BK; Oreb BF; Farrant DI; Gilliand Y*; Freund
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Fizeau Interferometer. Optical Engineering. 1999.
Farrant; D.I.; Kaufmann; G.H.; Petzing; J.N.; Tyrer; J.R. and
Oreb, and B.F. Transient deformation measurement using dual-pulse
addition ESPI, 2830.
Farrant; D.I.; Leistner; A.J.; Oreb; B.F.; Suchting; M.A. and
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Conf. on Optical Manufacturing and Testing II, San Diego USA,
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Farrant D; Hariharan P; Leistner A J; Oreb B F; Suchting M, and
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measurement using a Ronchi test with a phase-shifted sinusoidal
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EllipsometryNew Zealand .
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Hariharan P; Oreb B F, and Freund C H. Stroboscopic holographic
interferometry: measurements of vector components of a vibration.
Appl. Opt. 1987; 26(18):3899903.
Hariharan P; Oreb B F, and Leistner A J. High precision digital
interferometry: its application to the production of an ultrathin
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Hegedus and Z.S. High accuracy shape measurement in industry.
China; 1985.
Hegedus and Z.S. Light sectioning: a fast. 3D shape measuring
method, Seminar on Shape Analysis.
Hegedus and Z.S. Optical measurement and testing technologies.
Hegedus; Z.S.; and Farrant, and D. Tread extrusion measurement.
Feasibility Study for South Pacific Tyres.
Hegedus; Z.S.; and Oreb, and B.F. Corneal Shape Measurement.
Feasibility Study for Medmont Pty. Ltd.
Hegedus; Z.S.; Oreb; B.F.; Farrant; D.; Freund; C.H.; Walsh;
C.J.; Buckley; M.; Adams; R. and Berman, and M. Measurement of
roll-imprinted shafts by light sectioning.
Hegedus; Z.S. and Small, and G.W. Automatic profile measurement
using two dimensional CCD arrays. 1982.
Hegedus; Z.S. and Small, and G.W. Dynamic, non-contract profile
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1979.
Hegedus; Z.S. Oreb; B.F.; Farrant; D; Freund; C.H.; Walsh; C.J.;
Buckley; M.; Adams; R.; and Berman, and M. Measurement of roll-imprinted
input shafts by lights sectioning.
Hegedus Z S and Oreb B F. Corneal shape measurement. 1994(C00120).
Hegedus Z S; Oreb B F; Farrant D; Freund C H; Walsh C J; Buckley
M; Adams R, and Berman M. Measurement of roll-imprinted input
shafts by lights sectioning. 1991(C0040).
Hegedus Z S and Small G W. Automatic profile measurement using
two-dimensional CCD arrays. Proc. Radio Res. Bd. Semin. Image
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Acta Polytech. Scand. Appl. Phys. 1985; 150(2):1014.
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in industrial shape measurement. Proc. of the Symp. on Dimensional
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Hibino; K. Farrant; D.; Ward; B, and and Oreb B.F. Quantitative
wavefront measurement using a Ronchi test with a phase-shifted
sinusoidal grating.
Kenny M J; Leistner A J; Walsh C J; Fen K; Giardini W J; Wielunski
L S, and Netterfield R P and Ward B R. Precision Determination
of the Density of a Single Crystal Silicon Sphere and Evaluation
of the Avogadro ConstantSydney; 2000.
Kenny M J; Netterfield R; Wielunski L S, and Beaglehole D. Ellipsometry
Measurements of Thickness of Oxide and Water Layers on Spherical
Flat Silicon SurfacesWagga Wagga; 1998.
Kenny M J; Walsh C J; Leistner A J; Fen K; Giardini W J, and
Wielunski L S and Ward B R. Determination of the Avogadro Constant
from Precision Density Measurements on a Silicon SphereSydney;
2000.
Larkin; K.G. Fairman; P.S.; Farrant, and D.I. and Oreb. B.F.
Surface relief measurements on a cylindircal substrate.
Larkin K G; Fairman P S; Farrant D I, and Oreb B F. Surface Relief
Measurements on a Cylindrical Substrate; 1991.
Leistner; A.J.; Oreb; B.F.; and Hariharan, and P. Measurement
techniques in high precision optical component fabrication. Aust.
Lasers and Optics . 1984; 2: 2124.
---. High precision, large diameter single-crystal silicon spheres:
their fabrication and measurement of spericity. SPIE Proceedings;
Optic.Man. & Testing - . 1995; 2536:30216.
Leistner A J and Giardini W J. Fabrication and sphericity measurements
of single crystal silicon spheres. Metrologia. 1994; 31:23143.
Leistner A J; Oreb B F, and Hariharan P. Measurement techniques
in high precision optical component fabrication. Proc. Sci. Tech.
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Leistner AJ; Oreb BF, and Seckold J. Fabrication and metrology
of km-scale radii on surfaces of master tooling; 1998.
Longson B H; Small G W, and Hegedus Z S. Automated measurement
of rail profiles. Proc. of the Railway Eng. Symp. - . 1983:1514.
Lucas; J.G. and Oreb, and B.F. Azimuth subsystem measurement.
M Glass and R P Netterfield . Thin Film Measurement Instrument
for ALUSUISSE Laboratory Tests and Instruction Manual ; 2000.
Macintyre I; Dunn P; Kearney P; Auty G; Gardner J; Freund C;
Atkinson E; Walsh C; Berman M; Buckley M; Breen E; Sun C; Clerk
F; Rawlinson W, and Pratt D. NSW-RTA automated pavement crack
measuring project. 1994(C00115).
Matsuda K; Barnes TH; Oreb BF, and Sheppard CJR. Focal Length
Measurements using Multiple Beam Shearing InterferometrySydney
University.
Matsuda K; Barnes TH; Oreb BF, and Sheppard CJR . Position Magnifying
Sensor Using Multiple Beam Shearing InterferometrySydney Uni.
Matsuda K; Barnes TH; Oreb BF*, and Sheppard CJR (*CSIRO). Focal
Length Measurement by Multiple Beam Shearing IntereferenceVienna;
1999.
Matsuda K; Barnes TH; Oreb BF *, and Sheppard CJR (*CSIRO). Focal
length measurement by multiple beam shearing interferometry. Applied
Optics . 1999.
Murphy AB and Netterfield RP. Spectroscopic ellipsometry measurements
of Zeus coatings on painted surfaces; 2000.
Nakano Y; Farrant DI, and Oreb BF. Theoretical interpretation
for measuring inhomogeneous phase objects using a gratingAdelaide;
1997.
Netterfield; R.P.; Martin; P.J. and Kinder, and T.J. Kerr rotation
measurement system. 1991.
Netterfield R. Ellipsometric measurements of the thickness of
surface layers on metal surfaces; 1997.
---. Measurement of the surface roughness of four aluminium foil
samples. Confidential Report, Dec. 1994. 1994(C00123).
---. Measurement of the thickness of postlube oil on aluminium
can stock. Confidential Report, Aug. 1994. 1994(C00114).
---. Materials for magneto-optical storage. Kerr rotation measurement
system. 1991(C0043).
Oreb and B.F. Feasibility study report on measurement f bifocal
segment dimensions, Confidential Report CSIRO DAP, NA2/0113/02
Dec. (1988).
Oreb and B.F. Holographic Interferometry Measurements of hydrophone,
Confidential report CSIRO DAP NA2/59, 1988.
Oreb; B.F.; and Farrant, and D.I. Shape measurement of lens surfaces
by projected fringe profilometry.
Oreb; B.F.; Hegedus; Z.; Ciddor; P.E. and Hariharan, and P. ''Feasibility
study report on measurement of three dimensional contours.
Oreb; B.F.; Hegedus; Z.S; Ciddor; P.E. and Hariharan, and P.
. Measurement of three dimensional contours.
Oreb; B.F.; Hegedus; Z.S. and Farrant, and D.I. Non-contact Shape
Measurements for Machine Vision Application ; 1990.
Oreb; B.F.; Hegedus; Z.S. and Farrant, and D.I. Non-contact shape
measurements for machine vision application. Proc. ICME 90 Conf,
Wollongong, July (1990).
Oreb; B.F.; Larkin; K. and Farrant, and D. Measurement of cast
aluminium surface for Comalco Research Centre.
Oreb; B.F.; Larkin; K.G.; Fairman; P.S.; Gilliand; Y. and Ghaffari,
and M. Development of prototype instrument for non-contact shape
measurement of master tooling at the Royal Australian Mint: Stage
1 Report. CSIRO DAP Tech. Mem. C0029, 1990.
Oreb; B.F.; Larkin; K.G.; Farrant D. I. and Fairman, and P.S.
Surface relief measurements for cast aluminium samples for Comalco
Research Centre.
Oreb.; B.F. and Farrant, and D. Measurement of ceramic glove
formers for Ansell International.
Oreb; B.F. and Lucas, and J.G. Conical flare subsystem measurement
- touchdown and threshold tests.
Oreb.; B.F. Fairman; P.; Farrant; D.; Larkin; K. and Walsh, and
C.J. Measurement report of a used quarter dollar coin.
Oreb B; Green K, and Pavlovic E and Walsh C. Interferometric
measurement of refractive index homogeneity on polished substrates
Adelaide; 2000.
Oreb, B.; Leistner, A.; Billingsley, G.; Kells, B., and Camp,
J. Interferometric measurment of refractive index inhomogeneity
on polished sapphire substrates: application to LIGO-II. Proc.
SPIE10 pp.
Oreb B. and Walsh C.J. and Leistner A.J. Precision interferometric
measurement of right angles with the aid of an etalon; 2000.
---. Holographic Interferometry measurements of hydrophone. 1988(C0072).
---. Measurement of bifocal segment dimensions. 1988.
Oreb B F; Fairman P; Farrant D; Larkin K, and Walsh C J. Measurement
report of a used quarter dollar coin. 1990(99).
Oreb B F; Farrant D; Fairman P, and Walsh C J. Measurement report
on a Canadian Commemorative Dollar Coin. 1990(100).
Oreb B F; Hegedus Z S, and Farrant D I. Non-contact shape measurements
for machine vision application. Proc. of the 5th Int'l Conf. on
Manufacturing Engineering 1990, I.E. Aust. - . 1990:3604.
Oreb B F; Larkin K, and Farrant D. Measurement of cast aluminium
surface for Comalco Research Centre. 1991(103).
Oreb B F; Larkin K G; Farrant D I, and Fairman P S. Surface relief
measurements of cast aluminium samples for Comalco Research Centre.
1991(C0044).
Oreb, B. F.; Leistner, A. J.; Billingsley, G. L.; Kells, B.,
and Camp, J. Interferometric measure of refractive index inhomogeneity
on polished sapphire substrates: application to LIGO-II. SPIE
46th Annual Meeting; San Diego, Calif.
---. Conical flare subsystem measurement - touchdown and threshold
tests. 1976.
Oreb BF; Farrant DF; Walsh CJ; Leistner AJ; Lesha FJ; Fairman
PS, and Sona CM. Metrology of LIGO Core OpticsDenver.
Oreb BF; Farrant DI; Walsh CJ; Leistner AJ; Lesha FJ, and Fairmn
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1997: 21.
P Hariharan. Interferometric measurements of small-scale irregularities:
highly reflecting surfaces. Optical Engineering.
R P Netterfield; D J Drage; C H Freund; C J Walsh; A J Leistner;
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Small; G.W. and Hegedus, and Z.S. Measurement of rail cross-section
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Small; G.W. and Hegedus, and Z.S. Stroboscopic electro-optical
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Small; G.W. and Hegedus, and Z.S. System for automatic, non-contracting
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Takatsuji; T.; Oreb; B.F.; Farrant; D.I. and Fairman, and P.S.
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Takatsuji; T.; Oreb; B.F.; Farrant; D.I. and Tyrer, and J.R.
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Takatsuji; T.; Oreb; B.F. and Farrant, and D.I. Error considerations
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Takatsuji; T. and Oreb, and B.F. Application of Fourier transform
method to ESPI for two-dimensional displacement measurement.
Takatsuji; T. and Oreb, and B.F. Simultaneous measurements of
vector components of displacement by ESPI and FFT techniques.
Takatsuji T and Oreb B F. Application of Fourier transform method
to ESPI for two-dimensional dispalcement measurement. Proc. of
the ADSX, Brisbane - .
Takatsuji T; Oreb B F; Farrand D I, and Tyrer J R. Simultaneous
measurement of three orthogonal components of displacement by
electronic speckle pattern interferometry and Fourier transform
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Takatsuji T; Oreb B F, and Farrant D I amd Fairman P S. Simultaneous
measurement of vector components of displacement by ESPI and FFT
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Takatsuji T; Oreb BF, and Farrant DI & Tyrer JR. Simultaneous
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electronic speckle-pattern interferometry and the Fourier transform
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Walsh C J. A CO$_2$ laser interferometer for long distance measurement.
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1986:116.
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Walsh C J and Brown N. A computer-controlled multiwavelength
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Walsh C.J.; Pavlovic E., and Green K. and Oreb B. Interferometric
measurement of refractive index homogeneity on polished substratesAdelaide;
2000.
Walsh CJ; Leistner AJ; Oreb BF; Seckold J; Farrant DI, and Pavlovic
E. Metrology of transmission optics for LIGO; 1998.
Walsh CJ; Leistner AJ; Oreb BF; Seckold JA; Farrant DI, and Pavlovic
E. Metrology of Transmission Optics for LIGODenver, July 99.
Walsh CJ; Leistner AJ; Seckold J; Oreb BF, and Farrant DI. Fabrication
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Ward; B.K.; Oreb; B.F.; Ghaffari; M.; Maconochie; P.; Cheung;
L. and Poniewierski, and J. The design and performance of an optical
system used to generate a light stripe for relief measurement
on 60 metre highwalls in open-cut mines.
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